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CAIDAO "high-speed domestic atomic force microscope" appeared in the micro-nano electronics industry forum

Views: 0     Author: Site Editor     Publish Time: 2023-05-16      Origin: Site

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May 13 -14th, Qingdao Garden Hotel, more than 300 guests from all over the country attended the "16th China Micro and Nano Electronics Technology Exchange and Academic Symposium". At the meeting, more than 70 experts, scholars and technical personnel made special reports on the general forum and two sub-forums.


conference speech 1

Figure 1: The host of the conference "Secretary General of China Semiconductor Industry Association" Zhao Xiaoning delivered the opening speech 

conference speech 2

Figure 2: Nearly 300 experts from enterprises, researchers from universities and research institutes participated in the discussion


Semiconductor is the "heart" of micro electronic information products, in the various aspects of national economy and social life is more and more widely used, promote the computing, consumer electronics, network communications, automotive electronics, medical health, military system, logistics, the development of new energy industry, guide the artificial intelligence, big data, the rise of new industries such as automatic driving, supporting the digital economy development.

Micro-nano devices are of vital importance to national economic growth, national defense security and core competitiveness, and the importance of matching nanoscale testing equipment is self-evident. Atomic force microscope, as a powerful and comprehensive function, nanoscale detection equipment, has gradually come to the center of the "stage" in the field of nanoscale detection.

Jiangsu CAIDAO precision instruments, integration of technical personnel at home and abroad, overcome difficult, independent research and development, launched its own domestic atomic force microscope, public debut at the meeting, we set up the reception booth on the BBS, yong-wei ma engineers made "high speed scanning atomic force microscope —— semiconductor key measuring equipment" communication.

AFM SPEECH


















Figure 3: "High-speed scanning atomic force microscope" by Mr.Ma Yongwei, engineer of Jiangsu Caidao Precision Instrument Co., LTD

CAIDAO AFM 1CAIDAO AFM 2


Figure 4: Jiangsu Caidao-Industrial (semiconductor) atomic force microscope


The exhibition and speech have attracted the active attention and consultation of the participants. Many experts and scholars have expressed their more in-depth needs to Caidao, and looked forward to further communication and cooperation.

AFM CONSULT 1AFM CONSULT 2

Figure 5: Participants actively consult with the atomic force microscope


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Caidao has become a national high-tech enterprise in high-end optical image measurement and various inspection instruments, CMM, and AOI automatic testing equipment research and development, production and sales services.

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